NDLI: Two new techniques for identifying opens on printed circuit boards: analog junction test, and radio frequency induction test

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Two new techniques for identifying opens on printed circuit boards: analog junction test, and radio frequency induction test

Content Provider	IEEE Xplore Digital Library
Author	Wrinn, J.
Copyright Year	1995
Description	Author affiliation: Assembly Test, Teradyne Inc., Walnut Creek, CA, USA (Wrinn, J.)
Abstract	The author describes the principles, implementation, strengths, weaknesses and applications of two vectorless test techniques developed by Teradyne. Examples drawn from users' experience demonstrate how unpowered testing can dramatically reduce test cost and cycle time while maintaining or improving fault coverage. Analog junction test (AJT) and RF induction test (RFIT) form part of Teradyne's vectorless test toolset. AJT uses simple analog characterization of pin pairs on the device, relying on the protection or parasitic diode in most devices to produce the signal that indicates correct board assembly. RFIT uses RF induction into the device-under-test from an overhead inducer. Detection of the induced AC signal on the device pins via the standard bed-of-nails fixture indicates good board assembly. Both AJT and RFIT offer entirely new capability to the test engineer in that they can detect resistive cold solder joints. These faults would otherwise pass a traditional vector test or even a functional test, while risking field failures.
File Size	103445
File Format	PDF
ISBN	0780329929
ISSN	10893539
DOI	10.1109/TEST.1995.529936
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-10-21
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Printed circuits Circuit testing Circuit faults Radio frequency Assembly Costs Protection Diodes Pins Fixtures
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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