NDLI: Supplying known good die for MCM applications using low cost embedded testing

Content Provider	IEEE Xplore Digital Library
Author	Frisch, A. Aigner, M. Almy, T. Greub, H. Hazra, M. Mohr, S. Naclerio, N. Russell, W. Stebnisky, M.
Copyright Year	1995
Description	Author affiliation: Tektronix Inc., Beaverton, OR, USA (Frisch, A.; Aigner, M.; Almy, T.)
Abstract	A ready supply of high quality Known Good Die (KGD) is essential for obtaining acceptable Multi-Chip Module (MCM) yields and reducing costs. Unfortunately, the testers needed for testing and screening VLSI chips to supply high quality KGD are quite expensive, especially for high speed or high pin count ICs. In addition, there are issues connected with testing accuracy-the tester environment may limit performance testing because of interconnect length and capacitance, and with burn-in-which may require temporary packaging of die. Building special test equipment is only cost effective if production volumes are large. Hence, a low cost alternative for at-speed testing that yields high quality die is needed to drive down the cost of low volume or prototype MCMs. This paper describes a double-blind experiment devised to prove the viability of a KGD methodology based upon wafer level test-using embedded performance testing circuits-and wafer level burn-in.
Starting Page	328
Ending Page	335
File Size	692010
Page Count	8
File Format	PDF
ISBN	0780329929
ISSN	10893539
DOI	10.1109/TEST.1995.529857
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-10-21
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Costs Circuit testing Software testing Silicon Timing Contracts Probes System testing Integrated circuit interconnections Test equipment
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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