NDLI: An 87×49 mutual capacitance touch sensing IC enabling 0.5 mm-diameter stylus signal detection at 240 Hz-reporting-rate with palm rejection

Content Provider	IEEE Xplore Digital Library
Author	Yoshida, S.-I. Hamaguchi, M. Morishita, T. Shinjo, S. Nagao, A. Miyamoto, M.
Copyright Year	2014
Description	Author affiliation: Sharp Corp., Nara, Japan (Yoshida, S.-I.; Hamaguchi, M.; Morishita, T.; Shinjo, S.; Nagao, A.; Miyamoto, M.)
Abstract	A touch sensing system capable of stylus input should have “palm rejection” function which allows the user to place one's palm on the surface of the touch sensor while writing with a stylus. In order to realize “palm rejection”, it is necessary to detect the small stylus while neglecting large signal from the palm. However this is not sufficient because small electrical noise injected through the palm into the touch sensor impedes stylus input signal in real use. This issue is because the injected noise propagates onto the touch sensor's sense channels which are capacitively-coupled with the palm and degrades the SNR of the stylus signal on the channels. A simple and effective technique to eliminate this issue is implemented in a newly developed 87×49 mutual capacitance touch sensing IC which is fabricated in an 85 nm CMOS technology. It achieves an SNR over 33 dB for a 0.5 mm-diameter stylus when a 10 Vp-p sinusoidal noise is injected to the stylus and the palm. Both the die area and the power consumption of a unit charge-to-voltage converter (CVC) designed for the IC are reduced to approximately 50% compared to those of the previous implementation [4]. In order not to report unwanted touches due to palm signals, a palm detection filter is implemented in the digital signal processor on the IC.
Starting Page	217
Ending Page	220
File Size	3267627
Page Count	4
File Format	PDF
ISBN	9781479940905
e-ISBN	9781479940899
DOI	10.1109/ASSCC.2014.7008899
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-11-10
Publisher Place	Taiwan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Solid state circuits Conferences alternating drive mutual capacitance touch sensing stylus palm rejection
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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