NDLI: A low-area and short-time scan-based embedded delay measurement using signature registers

Content Provider	IEEE Xplore Digital Library
Author	Katoh, K. Namba, K. Ito, H.
Copyright Year	2010
Description	Author affiliation: Department of Informatics & Imaging Systems, Chiba University, 1-33, Yayoi-cho, Inage-ku, Chiba-shi, 263-8522 Japan (Katoh, K.) \|\| Graduate School of Advanced Integration Science, Chiba University, 1-33, Yayoi-cho, Inage-ku, Chiba-shi, 263-8522 Japan (Namba, K.; Ito, H.)
Abstract	This paper presents a low-area and short-time scan design for delay measurement using signature registers. The number of redundant latches is reduced utilizing X bits of test data for the delay measurement. After that, with the optimization of the scan chain routing, the scan chain length is reduced without decrease of the number of the measurable paths. These techniques keep the area overhead in the same order of that of the conventional scan designs for testing. In addition, the techniques further reduce the measurement time. Evaluation shows that the area overhead is 22.1% larger and 24.0% smaller than standard scan design and enhanced scan design respectively, which is in the order of scan designs for test. The measurement time is 90% shorter than that of standard scan design.
Starting Page	311
Ending Page	314
File Size	238925
Page Count	4
File Format	PDF
ISBN	9781424452699
DOI	10.1109/VDAT.2010.5496751
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-04-26
Publisher Place	Taiwan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Time measurement Testing Measurement techniques Area measurement Clocks Delay effects Length measurement Routing Latches Circuits
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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