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Content Provider | IEEE Xplore Digital Library |
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Author | Ruifeng Guo Wu-Tung Cheng Kobayashi, T. Kun-Han Tsai |
Copyright Year | 2010 |
Description | Author affiliation: Mentor Graphics Corp., Wilsonville, OR 97070 USA (Ruifeng Guo; Wu-Tung Cheng; Kobayashi, T.; Kun-Han Tsai) |
Abstract | Small delay defect is becoming an important defect mechanism that leads to yield loss and performance hit in high performance VLSI designs. Small delay defects usually cause a small number of failures in production test patterns, and hence provide little evidence for logic fault diagnosis to isolate a defect. In this paper, we present a diagnostic test generation technique that targets creating more tester failures for a small delay defect in order to improve the diagnostic resolution. Experimental results show the effectiveness of the proposed technique. |
Starting Page | 224 |
Ending Page | 227 |
File Size | 382594 |
Page Count | 4 |
File Format | |
ISBN | 9781424452699 |
DOI | 10.1109/VDAT.2010.5496730 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2010-04-26 |
Publisher Place | Taiwan |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Timing Fault diagnosis Logic testing Test pattern generators Propagation delay Performance loss Very large scale integration Computational modeling Graphics Production |
Content Type | Text |
Resource Type | Article |
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