NDLI: The sensitivity analysis of the effect of single-event-upset on low-swing signaling driver

Content Provider	IEEE Xplore Digital Library
Author	Mahyuddin, N.M. Russell, G.
Copyright Year	2012
Description	Author affiliation: Dept. of Electrical, Electronic and Computer Engineering, Newcastle University, Newcastle-upon-Tyne, NE1 7RU United Kingdom (Russell, G.) \|\| School of Electrical and Electronic Engineering, Universiti Sains Malaysia, Engineering Campus, Nibong Tebal, 14300 Penang, Malaysia (Mahyuddin, N.M.)
Abstract	The reliability of electronic system has become a major issue as the advances in semiconductor technology reduce device dimensions. As device geometries shrink circuit packaging densities increase and circuit application become more susceptible to transient faults caused by the effects of neutron and alpha-particle strikes. Increases in the susceptibility to effects of particle strikes (single event upsets) have resulted from the reduction in node capacitance. With the introduction of new technologies in order to achieve low power and high performance with low cost area, the problem with SEUs is becoming more significant. Consequently in this work, in order to assess the reliability of low-swing signaling schemes, it is necessary to consider the factors that can affect the signal integrity of the interconnects. It is important to include the reliability analysis with respect to occurrence of SEUs early in the design stage to improve system robustness and explore the subsequent tradeoffs. From the results obtained, the mLVSD driver has been identified as the driver with the best SEU tolerance compared to other low-swing drivers. Subsequently, in terms of SEU tolerance, the results indicate a good tradeoff between introducing high bias current and increasing Vdd, is needed in order to meet reliability target and minimal power overhead.
Starting Page	1
Ending Page	4
File Size	234959
Page Count	4
File Format	PDF
ISBN	9781467356947
e-ISBN	9781467356961
DOI	10.1109/EDSSC.2012.6482817
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-12-03
Publisher Place	Thailand
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Power demand Circuit faults Single event upsets Integrated circuit reliability Transistors Integrated circuit modeling transient faults single event upsets low-swing signaling reliability critical charge
Content Type	Text
Resource Type	Article

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