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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Khare, J. Heineken, H.T. d'Abreu, M. |
| Copyright Year | 2000 |
| Description | Author affiliation: DFM/DFT Group, Level One Commun., Sacrameto, CA, USA (Khare, J.) |
| Abstract | Advances in technology have led to a drive towards system on chip (SoC) designs. However manufacturing and test costs have increased as rapidly as design complexity. Hence, in order to produce SoC designs at reasonable cost, both system-level and die-level cost trade-offs must be made. This paper illustrates the methodologies used in analyzing such trade-offs. Examples in the paper indicate that using advanced technologies to manufacture SoC designs may sometimes be detrimental in terms of total system costs. |
| Starting Page | 178 |
| Ending Page | 184 |
| File Size | 68013 |
| Page Count | 7 |
| File Format | |
| ISBN | 0769504876 |
| ISSN | 10639667 |
| DOI | 10.1109/ICVD.2000.812606 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2000-01-03 |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Costs System-on-a-chip Manufacturing Radio frequency Random access memory Packaging Graphics Logic Design for manufacture Design for testability |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering Hardware and Architecture |
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