NDLI: Early probabilistic reliability analysis of mechatronic systems

Content Provider	IEEE Xplore Digital Library
Author	Dorociak, R.
Copyright Year	2012
Description	Author affiliation: Heinz Nixdorf Institute, University of Paderborn, Fuerstenalle 11, 33102, Paderborn, Germany (Dorociak, R.)
Abstract	Mechatronic systems are based on the close interaction of several engineering domains and are characterized by a high complexity; the assurance of their reliability is therefore very challenging. Established reliability methods are typically conducted on detailed system designs. As a consequence, a great number of failures are first recognized very late in the product engineering process. Yet: the later failures are discovered, the more does it cost to eliminate or mitigate them. Therefore there is a need for reliability analysis methods and tools, which are used from early on, so iteration loops in the system integration are avoided. In this contribution a method for the early probabilistic analysis of the reliability of an advanced mechatronic system based on its principal solution is presented; it addresses the aforementioned need. The method supports modeling of the failure propagation within the specification of the principal solution of an advanced mechatronic system, which is the result of the engineering phase of conceptual design. For analysis purposes, the model of the failure propagation is translated into a Bayesian network, which enables sophisticated probability analyses. Using our method the critical weak points of the system under consideration are identified and respective countermeasures can be defined; the principal solution is made more reliable. The advantages of the method are shown in a case study from the field of railway technology — the innovative autonomous railway vehicle RailCab.
Starting Page	1
Ending Page	6
File Size	895990
Page Count	6
File Format	PDF
ISBN	9781457718496
ISSN	0149144X
e-ISBN	9781457718519
DOI	10.1109/RAMS.2012.6175464
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-01-23
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Mechatronics Bayesian methods Reliability Fault trees Unified modeling language Logic gates Probabilistic logic Principal Solution Bayesian networks Conceptual Design Fault Trees Mechatronic Systems
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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