NDLI: Efficient analysis of warm standby systems using central limit theorem

Content Provider	IEEE Xplore Digital Library
Author	Tannous, O. Liudong Xing
Copyright Year	2012
Description	Author affiliation: Department of Electrical and Computer Engineering, University of Massachusetts, Dartmouth 285 Old Westport Road, Dartmouth, MA 02747, USA (Liudong Xing) \|\| Department of Electrical and Computer Engineering, University of Massachusetts (UMass), Dartmouth, 285 Old Westport Road, Dartmouth, MA 02747, USA (Tannous, O.)
Abstract	In a warm standby sparing system, the standby units have time-dependent failure behavior; they have different failure parameters or in general distributions before and after they are used to replace the on-line faulty units. Such time-dependent behavior makes the reliability analysis of warm standby system a challenging task. Existing approaches to analyzing the reliability of warm standby systems include Markov-based methods, simulation-based methods, and combinatorial me thods. Those approaches, however, have one or more of the following limitations: 1) requiring long computation time especially when results with high degree of accuracy are desired, 2) requiring exponential time-to-failure distribution for system components, and 3) involving difficult tasks of computing convolution of multiple integrals. In this paper, based on the central limit theorem, a computationally-efficient approximate method is proposed for the reliability analysis of warm standby systems. The proposed approach has no limitation on the time-to-failure distributions for the system components. Several case studies using different time-to-failure distributions and system sizes are performed to demonstrate the application of the proposed approach.
Starting Page	1
Ending Page	6
File Size	659536
Page Count	6
File Format	PDF
ISBN	9781457718496
ISSN	0149144X
e-ISBN	9781457718519
DOI	10.1109/RAMS.2012.6175433
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-01-23
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Random variables Logic gates Weibull distribution Gaussian distribution Reliability theory Redundancy central limit theorem warm spare exponential distribution normal distribution
Content Type	Text
Resource Type	Article

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