NDLI: Accelerated aging in electrolytic capacitors for prognostics

Content Provider	IEEE Xplore Digital Library
Author	Celaya, J.R. Kulkarni, C. Saha, S. Biswas, G. Goebel, K.
Copyright Year	2012
Description	Author affiliation: ISIS, Vanderbilt University, 1025 16th Avenue, Nashville, TN, 37212, USA (Kulkarni, C.; Biswas, G.) \|\| NASA Ames Research Center (MCT), Prognostics Center of Excellence, MS 269-4, Moffett Field, CA 94035, USA (Saha, S.) \|\| NASA Ames Research Center (SGT Inc.), Prognostics Center of Excellence, MS 269-4, Moffett Field, CA 94035, USA (Celaya, J.R.) \|\| NASA Ames Research Center, Prognostics Center of Excellence, MS 269-1, Moffett Field, CA 94035, USA (Goebel, K.)
Abstract	The focus of this work is the analysis of different degradation phenomena based on thermal overstress and electrical overstress accelerated aging systems and the use of accelerated aging techniques for prognostics algorithm development. Results on thermal overstress and electrical overstress experiments are presented. In addition, preliminary results toward the development of physics-based degradation models are presented focusing on the electrolyte evaporation failure mechanism. An empirical degradation model based on percentage capacitance loss under electrical overstress is presented and used in: (i) a Bayesian-based implementation of model-based prognostics using a discrete Kalman filter for health state estimation, and (ii) a dynamic system representation of the degradation model for forecasting and remaining useful life (RUL) estimation. A leave-one-out validation methodology is used to assess the validity of the methodology under the small sample size constrain. The results observed on the RUL estimation are consistent through the validation tests comparing relative accuracy and prediction error. It has been observed that the inaccuracy of the model to represent the change in degradation behavior observed at the end of the test data is consistent throughout the validation tests, indicating the need of a more detailed degradation model or the use of an algorithm that could estimate model parameters on-line. Based on the observed degradation process under different stress intensity with rest periods, the need for more sophisticated degradation models is further supported. The current degradation model does not represent the capacitance recovery over rest periods following an accelerated aging stress period.
Starting Page	1
Ending Page	6
File Size	669792
Page Count	6
File Format	PDF
ISBN	9781457718496
ISSN	0149144X
e-ISBN	9781457718519
DOI	10.1109/RAMS.2012.6175486
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-01-23
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Capacitors Degradation Capacitance Aging Mathematical model Equations Stress Kalman Filter Prognostics PHM
Content Type	Text
Resource Type	Article

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