NDLI: Extremely low loss circuit for megawatt average power switch testing

Content Provider	IEEE Xplore Digital Library
Author	Cavazos, T.C. Burkes, T.R. McDuff, G.
Copyright Year	1989
Description	Author affiliation: Texas Tech University (Cavazos, T.C.)
Abstract	Testing of megawatt average power switches has become prohibitively expensive in conventional RLC circuits. The major costs are the power supply, the resistive load, the heat removal system, and electricity. A several hundred thousand dollar investment in a megawatt average power, high voltage supply to be completely utilized in a year-long life test can itself drive the cost of testing to several thousands dollars per hour. At this rate a single day's testing can cost as much as the device under test. If the cost of cooling water, ancillary equipment, electricity, and overhead is included, the total cost to life-test a few thousand dollar component can approach nearly one million dollars. To reduce these costs, a new class of high power pulse component test circuits have been developed to test megawatt average power devices at full power ratings, but with only kilowatts of input power. These "artificial" test circuits reduce the size of the power supply, nearly eliminate the cooling requirement, and reduce the power consumption to a reasonable and affordable level. The figure of merit for these circuits is expressed as Power Switched/Power In. This ratio can approach 100 as the efficiency of the artificial test circuit is optimized. The system described in this report is one of the new near loss-free test circuits. This particular circuit is specifically designed for lower voltage (<20 kV) components and includes provisions for pulse shaping along with an affordable way to test megawatt average power devices.
Starting Page	536
Ending Page	542
File Size	627787
Page Count	7
File Format	PDF
DOI	10.1109/PPC.1989.767542
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1989-06-11
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Switches Circuit testing Switching circuits RLC circuits Costs Voltage Life testing Power supplies Cooling Pulse shaping methods
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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