NDLI: The defect-centric perspective of device and circuit reliability

Content Provider	IEEE Xplore Digital Library
Author	Kaczer, B. Franco, J. Weckx, P. Roussel, P.J. Bury, E. Cho, M. Degraeve, R. Linten, D. Groeseneken, G. Kukner, H. Raghavan, P. Catthoor, F. Rzepa, G. Goes, W. Grasser, T.
Copyright Year	2015
Description	Author affiliation: imec, Leuven, Belgium (Kaczer, B.; Franco, J.; Weckx, P.; Roussel, P.J.; Bury, E.; Cho, M.; Degraeve, R.; Linten, D.; Groeseneken, G.; Kukner, H.; Raghavan, P.; Catthoor, F.) \|\| TUWien, Vienna, Austria (Rzepa, G.; Goes, W.; Grasser, T.)
Abstract	As-fabricated (time-zero) variability and mean device aging are nowadays routinely considered in circuit simulations and design. Time-dependent variability (reliability variability) is an emerging trend that needs to be considered in circuit design as well. This phenomenon in deeply scaled devices can be best understood within the so-called defect-centric picture in terms of an ensemble of individual defects and their time, voltage, and temperature dependent properties. The properties of gate oxide defects are discussed and it is shown how these properties can be used to construct time-dependent variability distributions and can be propagated up to transistor-level circuits.
Starting Page	218
Ending Page	225
File Size	1366161
Page Count	8
File Format	PDF
ISBN	9781467371339
ISSN	19308876
e-ISBN	9781467371353
DOI	10.1109/ESSDERC.2015.7324754
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-09-14
Publisher Place	Austria
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Logic gates Stress Degradation Integrated circuit reliability Field effect transistors Integrated circuit modeling circuit simulations variability reliability defects RTN BTI HCI
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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