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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Gong-Ru Lin Chun-Jung Lin |
| Copyright Year | 2003 |
| Description | Author affiliation: Inst. of Electro-Opt. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan (Gong-Ru Lin; Chun-Jung Lin) |
| Abstract | The defect-enhanced blue-green photoluminescence (PL) and electroluminescence (EL) characteristics in metal-oxide-semiconductor (MOS) diode made on 500 nm-thick multi-energy Si-ion-implanted, PECVD-grown SiO/sub 2/ film on (100)-oriented silicon substrate (SiO/sub 2/:Si/sup +/) after thermal annealing at 1100/spl deg/C are demonstrated. The optimized annealing time is 180 min for enhanced PL at 415 nm and 455 nm, which indicates the completely activation of the Si-O related species and the neutral oxygen vacancy (NOV) correlated irradiative defects, respectively. The pulsed-current based EL of the Ag/SiO/sub 2/:Si/sup +//Si/Ag MOS diode is initiated at threshold current of 280 mA, which exhibits a saturation effect at 965 mA after a power increment by nearly four order of magnitude. This corresponds a biased voltage of 6.2 V. The far-field EL emission pattern reveals different colors red-shifting from deep blue to fully green as the biased current increases up to saturation. The current-voltage analysis shows the turn-on voltage and the breakdown field of the MOS diode is 3 V and 130 kV/cm, respectively. |
| Sponsorship | IEEE Nanotechnol. Council IEEE Region 6 Western USA |
| Starting Page | 371 |
| Ending Page | 374 |
| File Size | 441255 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780379764 |
| DOI | 10.1109/NANO.2003.1231795 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-08-12 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Luminescence Current-voltage characteristics Diodes Annealing Breakdown voltage Photoluminescence Electroluminescence Semiconductor films Silicon Substrates |
| Content Type | Text |
| Resource Type | Article |
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