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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Pern, F.J. Glick, S.H. |
| Copyright Year | 2000 |
| Description | Author affiliation: Div. of Eng. & Reliability, Nat. Renewable Energy Lab., Golden, CO, USA (Pern, F.J.) |
| Abstract | The authors studied the electrical and optical performance stability of crystalline silicon solar cells that were encapsulated with different types of EVA (ethylene vinyl acetate) between a borosilicate glass superstrate and a glass or white TPT (Tedlar/polyester/Tedlar) substrate. Total internal light reflection from the white TPT layer enhanced the measured cell photocurrent by /spl sim/20.4% to 23.9% and the efficiency by /spl sim/17.4% to 20.8%, with a cell-to-sample area ratio of 23,3%. In comparison, the enhancements on the cell photocurrent were from /spl sim/5.0% to 7.0% when the cells were laminated between two borosilicate plates. The samples were exposed under to /spl sim/6.5 UV suns at 65/spl deg/C or heated in an oven at 105/spl deg/C and periodically characterized for electrical and optical losses. The results show that, when the samples were measured without black-masking over the non-cell areas, the cell efficiency decreased by /spl sim/0.3% to 8.9% and the fill factor changed by /spl sim/0% to 6.6% after 1133-h exposures. When the non-cell areas were masked, the measured cell efficiency losses became 4.1% to 9.0% and the fill factor losses from 0.5% to 5.2%, respectively. The electrical changes are irregular for the sample cells tested and are not proportional to the optical losses of EVA/TPT bi-layer. As an example, a cell's efficiency decreased by 8.9%, whereas is NREL-V11 EVA remained clear; and another cell lost 7.1% efficiency, whereas its slow-cure A9918 EVA browned with a 12.2% loss in integrated transmittance and an increase of 31.85 in yellowness index. |
| Starting Page | 1491 |
| Ending Page | 1494 |
| File Size | 429412 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780357728 |
| ISSN | 01608371 |
| DOI | 10.1109/PVSC.2000.916176 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2000-09-15 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Stability Silicon Photovoltaic cells Optical losses Area measurement Glass Photoconductivity Crystallization Optical reflection Sun |
| Content Type | Text |
| Resource Type | Article |
| Subject | Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering |
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