NDLI: Pincushion distortion correction in position-sensitive avalanche photodiodes

Content Provider	IEEE Xplore Digital Library
Author	Despres, P. Barber, W.C. Funk, T. McClish, M. Shah, K.S. Hasegawa, B.H.
Copyright Year	2005
Description	Author affiliation: Phys. Res. Lab., California Univ., San Francisco, CA (Despres, P.; Barber, W.C.; Funk, T.)
Abstract	Position-sensitive avalanche photodiodes (PSAPDs) are a promising alternative to photomultiplier tubes for the development of a new generation of gamma-ray imagers. They are compact solid-state devices that provide high quantum efficiency and gain, and they can achieve precise positioning over relatively large surfaces with few readout channels. This key feature is obtained by Anger-logic event positioning from the signals of four corner anodes printed on a resistive layer covering one of the PSAPD surface. This readout scheme provides high degree of multiplexing for reading position and energy information from the device, but leads to pincushion distortion in the spatial information due to the nonlinear charge sharing pattern associated with the potential across the resistive layer. We have developed a method to reproduce and correct this distortion based on finite-element simulations of the readout configuration. The resistive layer and the anodes are represented by a two-dimensional array of resistors and this circuit is numerically solved to obtain the signal on the four anodes for different current injection nodes. The relation between the injection positions and the resulting Anger positions is modeled and then used to correct nonlinearities in events positions obtained experimentally. The algorithm was tested on $^{99m}Tc$ flood images of a 16times16 array of 0.4times0.4times4 $mm^{3}$ CsI(TI) crystals and successfully restored the regular pattern. The correction procedure is fast and robust, and constitutes a step toward the realization of a low-cost, high-resolution gamma camera based on PSAPDs
Starting Page	2031
Ending Page	2034
File Size	430063
Page Count	4
File Format	PDF
ISBN	0780392213
ISSN	10957863
DOI	10.1109/NSSMIC.2005.1596732
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-10-23
Publisher Place	Puerto Rico
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Avalanche photodiodes Nonlinear distortion Anodes Photomultipliers Image generation Solid state circuits Finite element methods Circuit simulation Resistors Circuit testing
Content Type	Text
Resource Type	Article

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