NDLI: Performance improvement of large volume CdZnTe detectors

Content Provider	IEEE Xplore Digital Library
Author	Gostilo, V. Lisjutin, I. Loupilov, A. Ivanov, V.
Copyright Year	2004
Description	Author affiliation: Baltic Sci. Instrum., Riga, Latvia (Gostilo, V.; Lisjutin, I.; Loupilov, A.)
Abstract	The paper analyzes results of several projects devoted to manufacturing of large volume CZT detectors for safeguard purposes. It is shown that the final performance of such detectors depends on the quality of crystals, design of detectors and technology of their manufacturing. Coplanar grid contacts applied for the detectors based on 15/spl times/15/spl times/10 mm/sup 3/ crystals grown by different producers have also proved to perform well. The paper also analyzes the results of the inspection test of crystals which evidence that there is progress in growing high-quality crystals. The detectors were made by basic technology developed at the BSI for pixel and strip detectors, using special technological processes to obtain high intergrid resistivity and spectrometric performance. Despite the branched structure of coplanar grid contacts, the intergrid resistance of about 5-6 GOhm was achieved. Analysis of the differences in I-V and spectrometric characteristics of the detectors based on crystals grown by different manufacturers shows that there is high reproducibility of results for Yinnel Tech company's crystals. All detectors with a crystal volume of 15/spl times/15/spl times/10 mm/sup 3/ with varying contact topology have the total absorption efficiency of registration about 8%, energy resolution less than 2% on the energy 662 keV and the peak/Compton ratio better than 11. The best energy resolution of 10.5 keV (1.59%) was achieved at HV=2 kV and the optimal voltage of 60 V between the grids. The energy resolution of the detectors on energies 59.6 and 1332 keV was 7.9 and 14.5 keV, respectively.
Starting Page	4590
Ending Page	4595
File Size	2028810
Page Count	6
File Format	PDF
ISBN	0780387007
ISSN	10823654
e-ISBN	0780387015
DOI	10.1109/NSSMIC.2004.1466904
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-10-16
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Detectors Crystals Energy resolution Spectroscopy Pulp manufacturing Inspection Testing Strips Conductivity Contact resistance
Content Type	Text
Resource Type	Article

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