NDLI: Polycrystalline diamond detectors compared with silicon X-ray dosimeters for clinical use

Content Provider	IEEE Xplore Digital Library
Author	Ciancaglioni, I. Consorti, R. Rossi, M.C. Conte, G.
Copyright Year	2004
Description	Author affiliation: Dept. of Electron. Eng., Rome Univ. (Ciancaglioni, I.)
Abstract	Physical and metering characteristics of three room temperature X-ray dosimeters used in clinical applications, PTW diamond, Thompson MOSFET and Scanditronix silicon diode are compared with polycrystalline diamond X-ray detectors. Development of dosimeters based on natural diamond carried out by PTW have provided superior characteristics with respect to other solid state silicon devices such diodes or MOSFETs. Radiation hardness, soft tissue equivalence, lack of toxicity, negligible energy dependence and optimal sensitivity and reproducibility, have made PTW the ideal metering device for clinical dosimetry. However general use of natural dosimeters have been hindered by their rarity, very high cost and unpredictable electronic behavior due to lack of control on impurity content and crystal defects. Therefore, there have been a growing use of silicon dosimeters especially for on line configuration and in vivo dosimetry. However, both MOSFET and silicon diode do not appear to be ideal for such application for their short lifetime. Detectors based on polycrystalline diamonds seem to be the best candidate for future dosimetry since they have most of the characteristics of natural diamonds at potentially much lower cost. In this context, the performances of a laboratory made polycrystalline diamond device are compared to those of the three, PTW, Scanditronix and Thomson commercial dosimeters
Starting Page	4445
Ending Page	4447
File Size	1274565
Page Count	3
File Format	PDF
ISBN	0780387007
ISSN	10823654
e-ISBN	0780387015
DOI	10.1109/NSSMIC.2004.1466871
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-10-16
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	X-ray detection X-ray detectors Diodes Dosimetry MOSFET circuits Costs Temperature Solid state circuits Silicon devices Biological tissues
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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