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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Huang, C.-H. Lee, T.-L. Lin, H.-H. |
| Copyright Year | 1993 |
| Description | Author affiliation: Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan (Huang, C.-H.; Lee, T.-L.; Lin, H.-H.) |
| Abstract | Wide band gap materials, InAlAs and InAlGaAs, were used in the collector of double heterojunction bipolar transistors (DHBTs). Base-collector designs and their effects on the DC characteristics of the DHBTs were investigated. It is found that in the InAlAs/InGaAs/InAlAs DHBT, the unusual large conduction band discontinuity results in a two-dimensional electron gas (2DEG) stored in base-collector abrupt junction. This 2DEG will push the heterojunction spike up and cause a reach-through effect with a InGaAs space layer inserted between the base-collector junction. Junction grading seems to be the only method to remove the effect. For the InAlAs/InGaAs/InAlGaAs DHBT, the smaller the conduction band discontinuity, the less significant is the 2DEG effect. When the discontinuity is smaller than 0.27 eV, the knee-shape and reach-through characteristics disappear. |
| Starting Page | 439 |
| Ending Page | 442 |
| File Size | 312525 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780309936 |
| DOI | 10.1109/ICIPRM.1993.380589 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1993-04-19 |
| Publisher Place | France |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Indium gallium arsenide Double heterojunction bipolar transistors Indium compounds Heterojunction bipolar transistors Indium phosphide Optical materials Electrons Gallium arsenide Electric breakdown Molecular beam epitaxial growth |
| Content Type | Text |
| Resource Type | Article |
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