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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Liang Chen Zhiqun Li Qin Li Li Zhang Wei Li |
| Copyright Year | 2010 |
| Description | Author affiliation: Institute of RF- & OE-ICs, Southeast University, 210096 Nanjing, China (Liang Chen; Zhiqun Li; Qin Li; Li Zhang; Wei Li) |
| Abstract | A novel inductor model, which considers the magnetic and capacitive substrate coupling comprehensively, and a new fast approach for substrate network parameter extraction are presented in this paper. The introduction of substrate parasitic inductance (SPI) and the mutual inductance is based on the resonance characteristic of the measured substrate's Y-parameter and their physical meaning. A series of inductors were fabricated to build and verify the inductor model, using 0.13μm RF CMOS process. A good agreement between the measured data and model over a wide frequency range has been obtained. |
| Starting Page | 720 |
| Ending Page | 723 |
| File Size | 109590 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424457052 |
| e-ISBN | 9781424457083 |
| DOI | 10.1109/ICMMT.2010.5525041 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-05-08 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Spirals Inductors Magnetic resonance Semiconductor device modeling Couplings Parameter extraction Inductance measurement Radio frequency CMOS process Frequency measurement substrate parasitic inductance novel inductor model magnetic and capacitive coupling |
| Content Type | Text |
| Resource Type | Article |
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