NDLI: Multipoint sliding probe methods for in situ electrical transport property characterization of individual nanostructures

Content Provider	IEEE Xplore Digital Library
Author	Fan, Zheng Tao, Xinyong Li, Xiaodong Dong, Lixin
Copyright Year	2011
Description	Author affiliation: College of Chemical Engineering and Materials Science, Zhejiang University of Technology, Hangzhou, 310014, China (Tao, Xinyong) \|\| Department of Mechanical Engineering, University of South Carolina, 300 Main Street, Columbia, 29208, USA (Li, Xiaodong) \|\| Department of Electrical and Computer Engineering, Michigan State University, East Lansing, 48824-1226, USA (Fan, Zheng; Dong, Lixin)
Abstract	Sliding probe methods are designed for the in situ electrical property characterization of individual one-dimensional (1D) nanostructures by eliminating the contact resistance between the fixed-end support and the specimen. The key to achieve a high resolution is to keep a constant resistance between the other end of the specimen contacting to the sliding probe. To achieve this objective, we have developed several important techniques including multipoint continuous sliding, flexible probes, and specimen-shape adapting based on nanorobotic manipulation inside a transmission electron microscope (TEM). With a copper-nanowire-tipped probe, we have shown that a flexible probe facilitates the contact force control. The adapting of the shape of a probe tip is significant for keeping a constant contact area between the probe and the specimen. This can be implemented by using a soft probe or a tip with a shape resembling the profile of the specimen. Here we show that by flowing copper from a nanotube probe against the specimen, it is possible to make a well adapted shape of the tip to the specimen after the copper cooled down. By avoiding stick-slip motion and controlling the contact force and area, it will be possible to keep a constant contact resistance between the sliding probe and the specimen, hence significantly improve the measurement resolution. Sliding probe methods are an in situ technique characterized by higher resolution and simplicity in setup as compared with conventional two- and four-terminal methods, respectively. Furthermore, it is superior for local property characterization, which is of particular interest for hetero-structured nanomaterials and defect detection.
Starting Page	1705
Ending Page	1710
File Size	1341881
Page Count	6
File Format	PDF
ISBN	9781612844541
ISSN	21530858
e-ISBN	9781612844565
DOI	10.1109/IROS.2011.6094678
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-09-25
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Probes Resistance Nanostructures Electrical resistance measurement Contact resistance Conductivity Carbon electrical transport property Sliding probe methods in situ nanotechnology nanorobotic manipulation individual nanostructures
Content Type	Text
Resource Type	Article
Subject	Control and Systems Engineering Computer Science Applications Computer Vision and Pattern Recognition Software

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