NDLI: Some second-order effects participating on frequency-temperature behaviour of rotated Y-cut GaPO/sub 4/ resonators

Content Provider	IEEE Xplore Digital Library
Author	Nosek, J.
Copyright Year	2002
Description	Author affiliation: Int. Center for Piezoelectric Res., Tech. Univ. of Liberec, Czech Republic (Nosek, J.)
Abstract	In this paper, gallium orthophosphate (GaPO/sub 4/) resonators in the form of rotated Y-cuts vibrating in thickness-shear mode, are studied. The results of the measured and computed resonance frequency-temperature characteristics of fundamental and third harmonic of Y-cut GaPO/sub 4/ resonators vibrating in thickness-shear mode are presented. The calculation is based on the linear elastic stress-strain relations. For the verification of the frequency-temperature behaviour of rotated Y-cut GaPO/sub 4/ resonators, a new set of samples of three different orientations YXI (0/spl deg/), YXI (-11/spl deg/), and YXI (-16.4/spl deg/) was measured in our laboratory. The frequency-temperature behaviour of the piezoelectric resonator is mainly given by the temperature dependence of elastic stiffnesses and thermal expansion of the crystals, but they also depend a little on some second-order quantities such as size and arrangement of electrodes, resonator support, etc. This influence is described by the change of temperature coefficients and elastic stiffnesses. The different temperature coefficients of the plated and unplated (by electrode) part of the piezoelectric plate cause the different frequency-temperature characteristics of these parts of the resonator. The resonant-frequency characteristics also therefore depend on the dimension of the electrodes on the plated and unplated parts of the GaPO/sub 4/ resonator. The attention was paid especially to the influence of the piezoelectric properties of the GaPO/sub 4/ crystal, and the contribution of the elastic properties of the electrodes.
Sponsorship	IEEE Ultrasonics, Ferroelectrics, & Frequency Control Soc
Starting Page	337
Ending Page	341
File Size	410984
Page Count	5
File Format	PDF
ISBN	0780370821
DOI	10.1109/FREQ.2002.1075904
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2002-05-31
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Electrodes Frequency measurement Resonance Thickness measurement Vibration measurement Resonant frequency Rotation measurement Laboratories Temperature dependence Thermal expansion
Content Type	Text
Resource Type	Article

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