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Content Provider | IEEE Xplore Digital Library |
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Author | Yang He XiaoHui Ye JiangQing He |
Copyright Year | 2011 |
Description | Author affiliation: Naval University of Engineering, WuHan, China (Yang He; XiaoHui Ye) || Naval Equipment Department, Beijing, China (JiangQing He) |
Abstract | To settle the problem such as the low confidence level of the testability verification test conclusion resulting from the irrational sample allocation plan for mechatronics equipment, this paper proposes the sample allocation plan based on integrated multi-factor by analyzing some key factors that affect the confidence level of conclusion. The sample size of every UUT was counted by relative ratio of integrated multi-factor, which can optimize failure sampling structure and advance the representation of failure sampling set. Moreover, the single-step failure propagation algorithm was improved, and the algorithm can calculate failure propagation intensity more effectively. Finally, aimed at stabilization and tracking platform, this paper use the sample allocation plan based on integrated multi-factor to allocate samples. By analyzing the result, it proves that the plan can optimize failure sampling structure and improve the confidence level of the testability verification test conclusion. |
Starting Page | 1789 |
Ending Page | 1792 |
File Size | 330355 |
Page Count | 4 |
File Format | |
ISBN | 9781612847191 |
e-ISBN | 9781612847221 |
DOI | 10.1109/MEC.2011.6025831 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2011-08-19 |
Publisher Place | China |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Computers Mechatronics equipment Mechatronics Testability verification test The relative ratio of integrated multi-factor Sample allocation Educational institutions Resource management Mathematical model Circuit faults Equations |
Content Type | Text |
Resource Type | Article |
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