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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Ai-Qutayri, M.A. |
| Copyright Year | 2003 |
| Description | Author affiliation: Emirates Telecommun. Corp, Etisalat Coll. of Eng., Sharjah, United Arab Emirates (Ai-Qutayri, M.A.) |
| Abstract | This paper discusses the importance and difficulties associated with testing analog circuits in general and those residing within mixed-signal circuits in particular. It proposes a tested method that is not oriented towards specification testing. The method is based on the excitation of the circuit-under-test with a pseudo random binary sequence and the subsequent analysis of the captured response. The fault detection capabilities of the test and data analysis methods are demonstrated by applying them to a continuous time filter circuit operating in the midband frequency range. The study analyses the confidence in the detection with respect to the analysis method applied and circuit node being accessed. |
| Sponsorship | IEEE IEEE Circuits and Syst. Soc. Univ. of Sharjah Etisalat College of Eng. Emirates Telecommunications Corp |
| Starting Page | 603 |
| Ending Page | 606 |
| File Size | 275579 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780381637 |
| DOI | 10.1109/ICECS.2003.1301857 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-12-14 |
| Publisher Place | United Arab Emirates |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Filters Circuit testing Circuit faults Analog circuits Integrated circuit modeling Electrical fault detection Manufacturing processes Design for testability Educational institutions Binary sequences |
| Content Type | Text |
| Resource Type | Article |
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