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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Tsai, R. Chen, Y.C. Nishimoto, M. Yang, L.W. Okamura, W. Lai, R. |
| Copyright Year | 2000 |
| Description | Author affiliation: TRW Inc., Redondo Beach, CA, USA (Tsai, R.) |
| Abstract | Accurate MMIC (Monolithic Microwave Integrated Circuits) RF yield forecasting is a critical tool for proactively defusing yield problems and planning efficient use of manufacturing resources. TRW has investigated a method for forecasting the large-signal RF yield of HEMT MMICs that is based on a combination of statistical device modeling through an analytical, physical device model, and an empirical nonlinear device model. Using this hybrid nonlinear statistical device modeling method, we have been able to accurately simulate the variation of large-signal MMIC performance with manufacturing process variation. |
| Starting Page | 125 |
| Ending Page | 128 |
| File Size | 331918 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780359682 |
| ISSN | 10647775 |
| DOI | 10.1109/GAAS.2000.906307 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2000-11-05 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Radio frequency Analytical models Microwave integrated circuits Integrated circuit yield Monolithic integrated circuits Microwave devices HEMTs MMICs Predictive models Radiofrequency integrated circuits |
| Content Type | Text |
| Resource Type | Article |
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