NDLI: Efficient built-in self-repair strategy for embedded SRAM with selectable redundancy

Content Provider	IEEE Xplore Digital Library
Author	Huamin Cao Ming Liu Hong Chen Xiang Zheng Cong Wang Zhihua Wang
Copyright Year	2012
Description	Author affiliation: Tsinghua National Laboratory for Information Science and Technology, Institute of Microelectronics, Tsinghua University, Beijing 100084, China (Huamin Cao; Ming Liu; Hong Chen; Xiang Zheng; Cong Wang; Zhihua Wang)
Abstract	Built-In Self-Repair (BISR) with Redundancy is an effective yield-enhancement strategy for embedded memories. This paper proposes an efficient BISR strategy which consists of a Built-In Self-Test (BIST) module, a Built-In Address-Analysis (BIAA) module and a Multiplexer (MUX) module. The BISR is designed flexible that it can provide four operation modes to SRAM users. Each fault address can be saved only once is the feature of the proposed BISR strategy. In BIAA module, fault addresses and redundant ones form a one-to-one mapping to achieve a high repair speed. Besides, instead of adding spare words, rows, columns or blocks in the SRAMs, users can select normal words as redundancy. The selectable redundancy brings no penalty of area and complexity and is suitable for compiler design. A practical 4K × 32 SRAM IP with BISR circuitry is designed and implemented based on a 55nm CMOS process. Experimental results show that the BISR occupies 20% area and can work at up to 150MHz.
Starting Page	2565
Ending Page	2568
File Size	281056
Page Count	4
File Format	PDF
ISBN	9781457714146
e-ISBN	9781457714153
DOI	10.1109/CECNet.2012.6201846
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-04-21
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Algorithm design and analysis Couplings Built-In Self-Repair (BISR) Built-In Self-Test (BIST) Redundancy Random access memory Built-In Address-Analysis (BIAA) Built-in self-test Maintenance engineering Circuit faults SRAM Compilier
Content Type	Text
Resource Type	Article

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