NDLI: DREAMS: DFM Rule EvAluation using Manufactured Silicon

Content Provider	IEEE Xplore Digital Library
Author	Blanton, R.D. Wang, F. Xue, C. Nag, P.K. Xue, Y. Li, X.
Copyright Year	2013
Description	Author affiliation: ECE Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA (Blanton, R.D.; Wang, F.; Xue, C.; Nag, P.K.; Xue, Y.; Li, X.)
Abstract	DREAMS (DFM Rule EvAluation using Manufactured Silicon) is a comprehensive methodology for evaluating the yield-preserving capabilities of a set of DFM (design for manufacturability) rules using the results of logic diagnosis performed on failed ICs. DREAMS is an improvement over prior art in that the distribution of rule violations over the diagnosis candidates and the entire design are taken into account along with the nature of the failure (e.g., bridge versus open) to appropriately weight the rules. Silicon and simulation results demonstrate the efficacy of the DREAMS methodology. Specifically, virtual data is used to demonstrate that the DFM rule most responsible for failure can be reliably identified even in light of the ambiguity inherent to a nonideal diagnostic resolution, and a corresponding rule-violation distribution that is counter-intuitive. We also show that the combination of physically-aware diagnosis and the nature of the violated DFM rule can be used together to improve rule evaluation even further. Application of DREAMS to the diagnostic results from an in-production chip provides valuable insight in how specific DFM rules improve yield (or not) for a given design manufactured in particular facility. Finally, we also demonstrate that a significant artifact of DREAMS is a dramatic improvement in diagnostic resolution. This means that in addition to identifying the most ineffective DFM rule(s), validation of that outcome via physical failure analysis of failed chips can be eased due to the corresponding improvement in diagnostic resolution.
Sponsorship	IEEE Counc. Electron. Design Autom.
Starting Page	99
Ending Page	106
File Size	783602
Page Count	8
File Format	PDF
ISBN	9781479910717
ISSN	10923152
DOI	10.1109/ICCAD.2013.6691104
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-11-18
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Layout Integrated circuits Databases Probability Silicon Sociology Statistics
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Computer Science Applications Software

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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