NDLI: Integration of total internal reflection and atomic force microscopy (TIRFM-AFM) to study stress transduction mechanisms in endothelial cells

Content Provider	IEEE Xplore Digital Library
Author	Mathur, A.B. Truskey, G.A. Reichert, W.M.
Copyright Year	1999
Description	Author affiliation: Dept. of Biomed. Eng., Duke Univ., Durham, NC, USA (Mathur, A.B.)
Abstract	The purpose of this study was to integrate atomic force microscopy (AFM) and total internal reflection fluorescence microscopy (TIRFM) data to determine the effect of localized force application over the cell surface on the cell's focal contacts size and position. TIRFM gives detailed information on the cell-substrate contact regions and AFM is a tool for elasticity measurements, force application, and topographic surface mapping of the cell. Elasticity measurements indicated that the nuclear region was stiffer than the cell body. Following application of nanonewtons force above the nucleus, the cell-substrate contacts rearranged to offset the force. It is evident that the stress applied to the upper surface of the cell is transmitted to the cell-substrate contact region.
File Size	154429
File Format	PDF
ISBN	0780356748
ISSN	1094687X
DOI	10.1109/IEMBS.1999.802020
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1999-10-13
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Atomic force microscopy Reflection Internal stresses Surface topography Fluorescence Elasticity Biomedical measurements Force measurement Biomedical engineering Atomic measurements
Content Type	Text
Resource Type	Article

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