NDLI: Line-sweep: Cross-ratio for wide-baseline matching and 3D reconstruction

Content Provider	IEEE Xplore Digital Library
Author	Ramalingam, S. Antunes, M. Snow, D. Gim Hee Lee Pillai, S.
Copyright Year	2015
Description	Author affiliation: Interdiscipl. Centre for Security, Reliability & Trust, Univ. of Luxembourg, Luxembourg City, Luxembourg (Antunes, M.) \|\| Mitsubishi Electr. Res. Labs., Cambridge, MA, USA (Ramalingam, S.; Snow, D.; Gim Hee Lee) \|\| Massachussetts Inst. of Technol., Cambridge, MA, USA (Pillai, S.)
Abstract	We propose a simple and useful idea based on cross-ratio constraint for wide-baseline matching and 3D reconstruction. Most existing methods exploit feature points and planes from images. Lines have always been considered notorious for both matching and reconstruction due to the lack of good line descriptors. We propose a method to generate and match new points using virtual lines constructed using pairs of keypoints, which are obtained using standard feature point detectors. We use cross-ratio constraints to obtain an initial set of new point matches, which are subsequently used to obtain line correspondences. We develop a method that works for both calibrated and uncalibrated camera configurations. We show compelling line-matching and large-scale 3D reconstruction.
Starting Page	1238
Ending Page	1246
File Size	1362480
Page Count	9
File Format	PDF
ISSN	10636919
e-ISBN	9781467369640
DOI	10.1109/CVPR.2015.7298728
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-06-07
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Three-dimensional displays Cameras Image reconstruction Calibration Accuracy Feature extraction Detectors
Content Type	Text
Resource Type	Article
Subject	Computer Vision and Pattern Recognition Software

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