NDLI: Person re-identification by Local Maximal Occurrence representation and metric learning

Content Provider	IEEE Xplore Digital Library
Author	Shengcai Liao Yang Hu Xiangyu Zhu Li, S.Z.
Copyright Year	2015
Description	Author affiliation: Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China (Shengcai Liao; Yang Hu; Xiangyu Zhu; Li, S.Z.)
Abstract	Person re-identification is an important technique towards automatic search of a person's presence in a surveillance video. Two fundamental problems are critical for person re-identification, feature representation and metric learning. An effective feature representation should be robust to illumination and viewpoint changes, and a discriminant metric should be learned to match various person images. In this paper, we propose an effective feature representation called Local Maximal Occurrence (LOMO), and a subspace and metric learning method called Cross-view Quadratic Discriminant Analysis (XQDA). The LOMO feature analyzes the horizontal occurrence of local features, and maximizes the occurrence to make a stable representation against viewpoint changes. Besides, to handle illumination variations, we apply the Retinex transform and a scale invariant texture operator. To learn a discriminant metric, we propose to learn a discriminant low dimensional subspace by cross-view quadratic discriminant analysis, and simultaneously, a QDA metric is learned on the derived subspace. We also present a practical computation method for XQDA, as well as its regularization. Experiments on four challenging person re-identification databases, VIPeR, QMUL GRID, CUHK Campus, and CUHK03, show that the proposed method improves the state-of-the-art rank-1 identification rates by 2.2%, 4.88%, 28.91%, and 31.55% on the four databases, respectively.
Starting Page	2197
Ending Page	2206
File Size	494196
Page Count	10
File Format	PDF
ISSN	10636919
e-ISBN	9781467369640
DOI	10.1109/CVPR.2015.7298832
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-06-07
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Measurement Image color analysis Databases Feature extraction Robustness Cameras Histograms
Content Type	Text
Resource Type	Article
Subject	Computer Vision and Pattern Recognition Software

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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