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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Saha, B. Celaya, J.R. Wysocki, P.F. Goebel, K.F. |
| Copyright Year | 2009 |
| Description | Author affiliation: MCT, Inc., NASA Ames Research Center, MS 269-3, Moffett Field, CA 94035, USA (Saha, B.) || RIACS, NASA Ames Research Center, MS 269-4, Moffett Field, CA 94035, USA (Celaya, J.R.) || NASA Ames Research Center, MS 269-4, Moffett Field, CA 94035, USA (Goebel, K.F.) || ASRC Aerospace Corp., NASA Ames Research Center, MS 213-15, Moffett Field, CA 94035, USA (Wysocki, P.F.) |
| Abstract | Electronics components have an increasingly critical role in avionics systems and in the development of future aircraft systems. Prognostics of such components is becoming a very important research field as a result of the need to provide aircraft systems with system level health management information. This paper focuses on a prognostics application for electronics components within avionics systems, and in particular its application to an Isolated Gate Bipolar Transistor (IGBT). This application utilizes the remaining useful life prediction, accomplished by employing the particle filter framework, leveraging data from accelerated aging tests on IGBTs. These tests induced thermal-electrical overstresses by applying thermal cycling to the IGBT devices. In-situ state monitoring, including measurements of steady-state voltages and currents, electrical transients, and thermal transients are recorded and used as potential precursors of failure. |
| Starting Page | 1 |
| Ending Page | 7 |
| File Size | 454372 |
| Page Count | 7 |
| File Format | |
| ISBN | 9781424426218 |
| ISSN | 1095323X |
| DOI | 10.1109/AERO.2009.4839676 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-03-07 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Electronic components Aerospace electronics Insulated gate bipolar transistors Aircraft Information management Bipolar transistors Particle filters Accelerated aging Life testing Condition monitoring |
| Content Type | Text |
| Resource Type | Article |
| Subject | Aerospace Engineering Space and Planetary Science |
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