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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Corno, F. Patel, J.K. Rudnick, E.M. Sonza Reorda, M. Vietti, R. |
| Copyright Year | 1998 |
| Description | Author affiliation: Dipt. di Autom. e Inf., Politecnico di Torino, Italy (Corno, F.) |
| Abstract | This paper proposes a method to enhance topological ATPG algorithms by exploiting some information computed through symbolic techniques. Since symbolic techniques can only be applied to small circuits, suitable circuit portions (named macros) are first selected, and then symbolic techniques are used to analyze their state graphs. The topological ATPG algorithm benefits from this analysis to bound its search tree. Experimental results show that the proposed approach is effective in reducing the required CPU time and increasing both the Fault Coverage and the Fault Efficiency. When high-level information about the circuit behavior and structure is available, it can be fruitfully exploited for macro selection. |
| Starting Page | 504 |
| Ending Page | 509 |
| File Size | 50743 |
| Page Count | 6 |
| File Format | |
| ISBN | 0818690992 |
| ISSN | 10636404 |
| DOI | 10.1109/ICCD.1998.727096 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1998-10-05 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Automatic test pattern generation Circuit testing Circuit faults State-space methods Partitioning algorithms Central Processing Unit Binary decision diagrams High performance computing Read only memory Algorithm design and analysis |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering Hardware and Architecture |
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