NDLI: Testing digital to analog converters based on oscillation-test strategy using sigma-delta modulation

Content Provider	IEEE Xplore Digital Library
Author	Hassan, I.H.S. Arabi, K. Kaminska, B.
Copyright Year	1998
Description	Author affiliation: Opmaxx Inc., Beaverton, OR, USA (Hassan, I.H.S.)
Abstract	This paper presents a new built-in self test technique for digital to analog converters (DAC). The technique consists of inserting the DAC under test in an oscillating loop forming a sigma-delta modulator. The DAC distortions are then seen at the sigma-delta output as a digital PDM information. A simple up/down counter converts the PDM output into a digital word that is used as test signature. Functional specifications such as offset, differential nonlinearity (DNL), integral nonlinearity (INL) and dynamic distortions of the DAC can be digitally measured using this technique. As a feature of sigma-delta modulation, the analog circuits used to form the modulator loop (integrator and comparator) do not need to be high performance in terms of accuracy and speed. This characteristic allows the technique to have no limitations for resting high frequency and high resolution DACs. This technique can also be applied to test ADC-DAC pair for applications that require both data converters in the same chip.
Starting Page	40
Ending Page	46
File Size	69111
Page Count	7
File Format	PDF
ISBN	0818690992
ISSN	10636404
DOI	10.1109/ICCD.1998.727021
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-10-05
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Digital-analog conversion Delta-sigma modulation Circuit testing Costs Automatic testing Integrated circuit testing Performance evaluation Built-in self-test Analog-digital conversion System testing
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Hardware and Architecture

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