NDLI: From (integrated) circuits to systems of systems on chip in five decades: How did and will (IC) test technology keep up?

Content Provider	IEEE Xplore Digital Library
Author	Ivanov, A.
Copyright Year	2007
Description	Author affiliation: Univ. of British Columbia, Vancouver (Ivanov, A.)
Abstract	The past five decades amount to mind boggling progress in IC design and manufacturing technology. In this period, we have gone from the inception of ICs to now what literally amounts to the integration of systems of systems on chip. Whereas experts debate the continued evolution of ICs according to Moore's law beyond the next decade, the advent of the complex integration of multi-physics systems is just in its infancy and is predicted to grow exponentially in the coming years. Designing and manufacturing complex ICs is of course a feat in itself. Testing and testability has often been taken for granted as a necessary (not to say evil) requirement. But who wants of an IC that cannot be duly tested, to ensure quality and reliability, especially when deployed in life-critical applications? Test technology, along with design technology has had to make enormous and rapid progress over the past half-century. Here, we highlight some of the key elements of IC test technology. We briefly mention some directions and challenges and opportunities for test technology in the near future, especially as multi-physics integrated systems of systems continue to emerge and progress on the volume production curves.
Starting Page	1542
Ending Page	1543
File Size	151865
Page Count	2
File Format	PDF
ISBN	9781424411757
ISSN	15483746
DOI	10.1109/MWSCAS.2007.4488835
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-08-05
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing System-on-a-chip Integrated circuit testing System testing Integrated circuit technology Manufacturing Moore's Law Application specific integrated circuits Life testing Production systems
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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