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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Chengson, D. Frazao, C. Wang, H.W. Billett, B. |
| Copyright Year | 1988 |
| Description | Author affiliation: Tandem Comput. Inc., Cupertino, CA, USA (Chengson, D.; Frazao, C.; Wang, H.W.; Billett, B.) |
| Abstract | The authors examine signal delay associated with distributed RC tree networks, and present an algorithm for computing distributed RC time constants. Skew measurements from a bipolar test chip utilizing various flip-flop loading configurations were used. The computer implementation of the algorithm used to check clock skew limits on a large bipolar ECL (emitter-coupled logic) gate array is also presented. On-chip clock skew, metal delays, and hold time margins are being analyzed and managed with this algorithm. The algorithm was implemented as an integral part of Tandem's CAD-based VLSI physical design system and is part of the system-wide clock skew management methodology.< |
| Starting Page | 2835 |
| Ending Page | 2837 |
| File Size | 182900 |
| Page Count | 3 |
| File Format | |
| DOI | 10.1109/ISCAS.1988.15529 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1988-06-07 |
| Publisher Place | Finland |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Clocks Delay effects Logic arrays Algorithm design and analysis Computer networks Distributed computing Semiconductor device measurement Testing Flip-flops Logic gates |
| Content Type | Text |
| Resource Type | Article |
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