NDLI: On the potential of current CNN cameras for industrial surface inspection

Content Provider	IEEE Xplore Digital Library
Author	Blug, A. Strohm, P. Carl, D. Hofler, H. Blug, B. Kailer, A.
Copyright Year	2012
Description	Author affiliation: Fraunhofer-Institute for Physical Measurement Techniques IPM, Heidenhofstr. 8, 79110 Freiburg, Germany (Blug, A.; Strohm, P.; Carl, D.; Hofler, H.) \|\| Fraunhofer-Institute for Mechanics of Materials IWM, Wöhlerstraße 11, 79108 Freiburg, Germany (Blug, B.; Kailer, A.)
Abstract	An important issue in industrial quality control is the inspection of rapidly moving surfaces for small defects such as scratches, dents, grooves, or chatter marks. This paper investigates the potential of the EyeRIS 1.3 camera as a state-of-the-art camera based on “cellular neural networks” (CNN) for this application in comparison to conventional image processing systems. Based on experimental data from an aluminum wire drawing process where defects with a lateral size of 100 μm have to be detected at feeding rates of 10 m/s, the potential specifications for other surface inspection applications are estimated. Using the relation between the lateral defect size and the feeding rate as a figure of merit, the CNN based system outperforms conventional image processing systems by an order or magnitude in this particular application. In general, the lighting system limits the performance at lower defect sizes and the computational power at larger defect sizes and fields of view.
Starting Page	1
Ending Page	6
File Size	2094414
Page Count	6
File Format	PDF
ISBN	9781467302876
ISSN	21650179
e-ISBN	9781467302890
DOI	10.1109/CNNA.2012.6331412
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-08-29
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Cameras Wires Lighting Image processing Light emitting diodes Inspection
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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