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Content Provider | IEEE Xplore Digital Library |
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Author | Crawford, T.M. Rogers, C.T. Silva, T.J. Kim, Y.K. |
Copyright Year | 1965 |
Abstract | We have simultaneously measured the second-harmonic magneto-optic Kerr effect and the magnetoresistance of patterned Ta/Ni/sub 81/Fe/sub 19//Cu/Ni/sub 81/Fe/sub 19//Ta spin-valve test structures. For fields applied parallel to the bias-current direction, we observed a one-to-one correlation between the magnetoresistance and the magnetization-dependent second-harmonic intensity. The dependence of the second-harmonic intensity on magnetic field indicates that the detected second-harmonic response arises largely from the top Ni/sub 81/Fe/sub 19//Ta interface. The existence of this one-to-one correlation implies that the second harmonic depends linearly on magnetization, thus offering a method for interface-specific magnetometry. |
Sponsorship | IEEE Magnetics Society |
Starting Page | 3598 |
Ending Page | 3600 |
Page Count | 3 |
File Size | 388475 |
File Format | |
ISSN | 00189464 |
Volume Number | 33 |
Issue Number | 5 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 1997-09-01 |
Publisher Place | U.S.A. |
Access Restriction | One Nation One Subscription (ONOS) |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Magnetooptic effects Kerr effect Testing Magnetic multilayers Optical films Magnetic materials Magnetic properties Magnetic field measurement Magnetic anisotropy Perpendicular magnetic anisotropy |
Content Type | Text |
Resource Type | Article |
Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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