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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Pan, G. Mapps, D.J. Kirk, K.J. Chapman, J.N. |
| Copyright Year | 1965 |
| Abstract | High resolution and real time domain images and magnetisation reversal processes were observed by Lorentz Microscopy with in-situ applied magnetic fields for patterned narrow strips of single layer and double layer CoNbZr films. Results were compared with the initial high frequency permeability measurement of the narrow strips. It was revealed that the domain structures and magnetisation reversal processes were distinctively different at the edge and at the central part of wide strips. The size of the edge domains was typically 3/spl sim/4 /spl mu/m-wide. Double walls were observed in dual-layer strips indicating some magnetostatic coupling between sublayers. The easy-axis state was sustained by double layer lamination for 3 /spl mu/m-wide strips. Distinct magnetisation reversal processes and domain structures were observed for single layer and double layer narrow strips. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 2857 |
| Ending Page | 2859 |
| Page Count | 3 |
| File Size | 877754 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 33 |
| Issue Number | 5 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1997-09-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Frequency Strips Magnetization reversal Image resolution Magnetic force microscopy Magnetic field measurement Magnetic films Permeability measurement Magnetic domains Magnetostatics |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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