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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Dee, R.H. Franzel, K.S. Cates, J.C. Crowell, R.W. |
| Copyright Year | 1965 |
| Abstract | A technique for measuring the wear rate of a tape recording head is described that can produce a theoretical dimensional resolution of 0.02 nm. Custom four wire elements are located in the gap of the actual recording head design to be tested (rather than using substitutes) and can be strategically placed to measure the wear rate across the width of the tape. Temperature compensation is achieved by measurement of a spare identical element in the head structure set back from the wear surface such that it does not receive wear. The wear rate at various locations across the head gap lines of NiZn ferrite heads have thus been obtained continuously as a function of the amount of CrO/sub 2/ tape passed and show that the wear rate is greater near the tape edges. Due to the high sensitivity of the test elements, use of long reels of tape and placement of multiple heads in the same tape path, comparisons of head contour shape and/or materials can be made in a very short test time.< |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 4179 |
| Ending Page | 4181 |
| Page Count | 3 |
| File Size | 299691 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 30 |
| Issue Number | 6 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1994-11-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Electric variables measurement Magnetic heads Materials testing Electrical resistance measurement Magnetic materials Surface resistance Contact resistance Lead Magnetic field measurement Life estimation |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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