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Content Provider | IEEE Xplore Digital Library |
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Author | Cross, R.W. Russek, S.E. Sanders, S.C. Parker, M.R. Barnard, J.A. Hossain, S.A. |
Copyright Year | 1965 |
Abstract | Giant magnetoresistance (GMR) was measured as a function of device size for patterned NiCoFe/Cu and NiFe/Ag films. For the quasi-granular NiCoFe/Cu films, the normalized maximum change in resistivity /spl Delta//spl rho///spl rho/ was 8% for most of the samples. For the NiFe/Ag films, antiparallel alignment was achieved through magnetostatic coupling, not exchange fields, with a /spl Delta//spl rho///spl rho/ of 4.5%. The films were patterned into stripes with Au current leads for size-effect measurements. The height of the stripes varied from 0.5 to 16 /spl mu/m and the track width varied from 1 to 16 /spl mu/m. Discrete switching events and anomalous low-field dips in the response were observed for both materials for small device sizes. Self-field and heating effects due to the applied current were investigated for the NiFeCo/Cu films. The effect of the self-field produced by the applied current was separated from the thermal contribution and was found to reduce the response by over 32% for a current density of 10/sup 7/ A/cm/sup 2/.< |
Sponsorship | IEEE Magnetics Society |
Starting Page | 3825 |
Ending Page | 3827 |
Page Count | 3 |
File Size | 290371 |
File Format | |
ISSN | 00189464 |
Volume Number | 30 |
Issue Number | 6 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 1994-11-01 |
Publisher Place | U.S.A. |
Access Restriction | One Nation One Subscription (ONOS) |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Giant magnetoresistance Transistors Size measurement Conductivity Magnetic separation Magnetostatics Couplings Gold Current measurement Magnetic field measurement |
Content Type | Text |
Resource Type | Article |
Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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