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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Honda, N. Ariake, J. Ouchi, K. Iwasaki, S. |
| Copyright Year | 1965 |
| Abstract | Hc/sub /spl perp// over 1000 Oe has been achieved for Co-Cr films deposited at room temperature and at an extremely high Ar pressure onto a Ti underlayer. Conditions for further high Hc/sub /spl perp// were studied. After optimization of the Ti underlayer thickness, an Hc/spl perp/ of 1370 Oe was obtained for Co-Cr films of 45 nm thick, in which a high c-axis orientation could be sustained by hetero-epitaxial growth. Magnetic isolation of columns was realized by a voided structure by shadowing effect at high deposition pressures and oxide formation. The high Hc/sub /spl perp// is determined by large perpendicular anisotropy, grain size and the magnetic isolation of columns, but the isolation manner very differs from the micro-segregation of Cr in conventional high Hc films deposited at high temperatures and low pressures,.< |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 4023 |
| Ending Page | 4025 |
| Page Count | 3 |
| File Size | 347660 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 30 |
| Issue Number | 6 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1994-11-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Coercive force Perpendicular magnetic recording Temperature Grain size Thickness measurement Sputtering X-ray diffraction Argon Glass Substrates |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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