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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Hang, J.H. Przybysz, J.X. |
| Copyright Year | 2002 |
| Abstract | Testing on a single-flux-quantum (SFQ) shift register fabricated with a SFQ Nb-AlO/sub x/Nb Josephson junction process indicates that a stable flux quantum can be stored in a rapid SFQ (RSFQ) shift register stage and be shifted by SFQ pulses. Design simulations showed that logic errors can occur in SFQ shift registers even though the circuit passes the average voltage test. Three-junction-per-stage shift registers had an advantage over the two-junction-per-stage shift register in handling data with successive 1's and in incorporating resistors to increase tolerance of trapped magnetic flux. Input and output buffers for data and clock pulses were added to get an RSFQ shift register to obtain correct performance. The highest error-free operation speed for the data with successive 1's is about half of the speed for propagation of a lone data 1. Error-free operation of SFQ shift registers with three junctions per stage could be obtained up to speeds of 30-60 GHz with Josephson junctions having I/sub c/R/sub n/ (critical-current-normal-resistance product) values of 600 mu V.< |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 2752 |
| Ending Page | 2755 |
| Page Count | 4 |
| File Size | 731380 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 3 |
| Issue Number | 1 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1993-03-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Shift registers Josephson junctions Logic testing Circuit testing Error-free operation Niobium Circuit simulation Logic design Logic circuits Voltage |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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