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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Aoki, Y. Kamei, M. Ogota, S. Usui, T. Morishita, T. |
| Copyright Year | 2002 |
| Abstract | Reflection high-energy electron diffraction (RHEED) with total-reflection-angle X-ray spectroscopy (TRAXS) has been applied to the chemical and structure analysis during preparation of YB/sub 2/Cu/sub 3/O/sub 7-x/ (YBCO) films. The characteristic X-rays of YL alpha , BaL alpha , and CuK alpha emitted even from 0.8-AA-thick YBCO were clearly observed by TRAXS. In addition, the surface sensitivity of this method was found to be comparable to or higher than that of Auger electron spectroscopy. From the RHEED observation, it was revealed that the lattice spacing drastically changes from 4.09 AA to 3.8 AA at a mean thickness of less than one unit cell of YBCO at the early growth stage.< |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 1598 |
| Ending Page | 1600 |
| Page Count | 3 |
| File Size | 324812 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 3 |
| Issue Number | 1 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1993-03-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Transistors Yttrium barium copper oxide X-rays Lattices Substrates Diffraction Surface finishing Dispersion Chemical analysis Energy management |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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