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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Bertotti, G. Fiorillo, F. Soardo, G. |
| Copyright Year | 1965 |
| Abstract | By using a recently developed theoretical model, which takes into proper account on a statistical basis the contributions to energy dissipation deriving from microscopic magnetization processes, a general loss expression is obtained, which permits one to compute total power losses, just knowing two parameters. These can easily be derived from a d.c. and a 50 Hz loss measurements in GO 3% SiFe, or from a single d.c. loss value and from the average grain size in NO 3%SiFe. The equation is used to compute total losses between d.c. and 100 Hz for peak inductions variable between 0.1 and 1.7 T in GO and NO laminations. Calculated losses are found to be in excellent agreement with experimental measurements performed on the studied materials over the same wide ranges of frequencies and peak inductions. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 3520 |
| Ending Page | 3522 |
| Page Count | 3 |
| File Size | 374329 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 23 |
| Issue Number | 5 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1987-09-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Magnetic losses Frequency Loss measurement Energy dissipation Magnetic force microscopy Magnetization processes Size measurement Grain size Equations Lamination |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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