NDLI: Film thickness and width dependence of output voltage response for read-out head using induced RF permeability change

Content Provider	IEEE Xplore Digital Library
Author	Iwasaki, H. Akiyama, J. Yatabe, S.
Copyright Year	1965
Abstract	For thin film magnetic read-out heads using induced RF permeability change, named an Active Head by the authors, the relation between the output voltage response to magnetic fields and domain behavior involved was investigated with film thickness and width as parameters. With decreasing film width, the output voltage change decreased markedly, especially for films about 200nm thick, while B-H curves changed from closed curves to square curves and high-density Neel walls appeared. It has been demonstrated that the decrease in output voltage change is associated with the suppression of magnetization rotation, due to high-density Neel walls. However, films with high-density Bloch walls showed relatively large output voltage change, even with decreasing film width. Films without high-density Neel walls, such as 800nm thick films, are preferable for the high sensitivity narrow track Active Head.
Sponsorship	IEEE Magnetics Society
Starting Page	2506
Ending Page	2508
Page Count	3
File Size	613618
File Format	PDF
ISSN	00189464
Volume Number	23
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1987-09-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Voltage Radio frequency Permeability Magnetic films Magnetic heads Magnetic domains Magnetic fields Magnetic domain walls Magnetization Thick films
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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