NDLI: Mission Profile-Based Reliability Design and Real-Time Life Consumption Estimation in Power Electronics

Content Provider	IEEE Xplore Digital Library
Author	Musallam, M. Chunyan Yin Bailey, C. Johnson, M.
Copyright Year	1986
Abstract	Power electronics are efficient for conversion and conditioning of the electrical energy through a wide range of applications. Proper life consumption estimation methods applied for power electronics that can operate in real time under in-service mission profile conditions will not only provide an effective assessment of the products life expectancy but they can also deliver reliability design information. This is important to aid in manufacturing and thus helps in reducing costs and maximizing through-life availability. In this paper, a mission profile-based approach for real-time life consumption estimation which can be used for reliability design of power electronics is presented. The paper presents the use of electrothermal models coupled with physics-of-failure analysis by means of real-time counting algorithm to provide accurate life consumption estimations for power modules operating under in-service conditions. These models, when driven by the actual mission profiles, can be utilized to provide advanced warning of failures and thus deliver information that can be useful to meet particular application requirements for reliability at the design stage. To implement this approach, an example of two case studies using mission profiles of a metro-system and wind-turbines applications is presented.
Sponsorship	IEEE Power Electronics Society
Starting Page	2601
Ending Page	2613
Page Count	13
File Size	1400216
File Format	PDF
ISSN	08858993
Volume Number	30
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Multichip modules Real-time systems Reliability Load modeling Insulated gate bipolar transistors Temperature measurement real time Electrothermal models life consumption mission profile physics of failure power electronics
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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