NDLI: Effects of High Dose Rate Ionizing Radiation on Fused Silica and Sapphire Films

Content Provider	IEEE Xplore Digital Library
Author	McLain, M.L. Hartman, F. Zarick, T.A. Hjalmarson, H.P. Gleason, J.D. McDonald, K. Sheridan, T.J.
Copyright Year	1963
Abstract	The effects of high dose rate electron beam exposures on the electrical conductivity of fused silica and sapphire films are investigated via modern experimental techniques. Transient measurements have been obtained for dose rates ranging from 3×10 ⁵ rad(Si)/s to 1×10 ¹⁰ rad(Si)/s and for pulse widths ranging from 50 ns to 500 ns. The data indicate that the radiation-induced conductivity (RIC) has a varying power-law relationship with dose rate (i.e., the power-law relationship for low dose rates is different than for high dose rates) and that the RIC coefficient (k c) increases at lower dose rates, peaks, and then decreases at higher dose rates. It is also shown that the RIC response of each film increases several orders of magnitude during a high-intensity ionizing radiation exposure and is linearly dependent on applied bias. Two-dimensional (2-D) numerical simulations are used to qualitatively capture the observed RIC response and provide insight into the physics of the induced current transients.
Sponsorship	IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD
Starting Page	4116
Ending Page	4121
Page Count	6
File Size	1166659
File Format	PDF
ISSN	00189499
Volume Number	60
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Linear accelerators Conductivity Electron traps Dielectrics Radiation effects Ionizing radiation transient radiation effects high dose rate ionizing radiation linear accelerator (LINAC) radiation-induced conductivity (RIC) RIC coefficient (k$_{c}$)
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering

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