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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Yung-Yu Hsu Gonzalez, M. Bossuyt, F. Vanfleteren, J. De Wolf, I. |
| Copyright Year | 1963 |
| Abstract | This paper discusses the optimization of a stretchable electrical interconnection between integrated circuits in terms of stretchability and fatigue lifetime. The interconnection is based on Cu stripes embedded in a polyimide-enhanced (PI-enhanced) layer. Design-of-experiment (DOE) methods and finite-element modeling were used to obtain an optimal design and to define design guidelines, concerning both stripe and layer dimensions and material selection. Stretchable interconnects with a PI-enhanced layer were fabricated based on the optimized design parameters and tested. In situ experimental observations did validate the optimal design. Statistical analysis indicated that the PI width plays the most important role among the different design parameters. By increasing the PI width, the plastic strain in the Cu stripes is reduced, and thus, the stretchability and fatigue lifetime of the system is increased. The experimental results demonstrate that the PI-enhanced stretchable interconnect enables elongations up to 250% without Cu rupture. This maximum elongation is two times larger than the one in samples without PI enhancement . Moreover, the fatigue life at 30% elongation is 470 times higher. |
| Sponsorship | IEEE Electron Devices Society |
| Starting Page | 2680 |
| Ending Page | 2688 |
| Page Count | 9 |
| File Size | 1833489 |
| File Format | |
| ISSN | 00189383 |
| Volume Number | 58 |
| Issue Number | 8 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-08-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Copper Strain Conductors Plastics Response surface methodology stress Design for experiments design optimization failure analysis finite element methods flexible electronics integrated circuit interconnections integrated circuit packaging materials reliability strain |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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