NDLI: High Volume Diagnosis in Memory BIST Based on Compressed Failure Data

Content Provider	IEEE Xplore Digital Library
Author	Mukherjee, N. Pogiel, A. Rajski, J. Tyszer, J.
Copyright Year	1982
Abstract	Embedded memories are increasingly identified as having potential for introducing new yield loss mechanisms at a rate, magnitude, and complexity large enough to demand major changes in fault diagnosis techniques. In particular, time-related or complex read faults that originate in the highest density areas of semiconductor designs require new methods to diagnose more complex faults affecting large groups of memory cells. This paper presents a built-in self-test (BIST)-based fault diagnosis scheme that can be used to identify a variety of failures in embedded random-access memory arrays. The proposed solution employs flexible test logic to record test responses at the system speed with no interruptions of a BIST session. It offers a simple test flow and enables detection of time-related faults. Furthermore, the way test responses are processed allows accurate and time-efficient reconstruction of error bitmaps. The proposed diagnostic algorithms use a number of techniques, including discrete logarithm-based counting with ring generators acting as very fast event counters and signature analyzers. Experimental results confirm high diagnostic accuracy of the proposed scheme and its time efficiency.
Sponsorship	IEEE Council on Electronic Design Automation IEEE Circuits and Systems Society
Starting Page	441
Ending Page	453
Page Count	13
File Size	1406838
File Format	PDF
ISSN	02780070
Volume Number	29
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Built-in self-test Circuit testing Logic testing Fault diagnosis Automatic testing Circuit faults System testing Fault detection Graphics Bandwidth fault diagnosis discrete logarithms embedded memory
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Electrical and Electronic Engineering Software

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