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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Sahu, B.N. Sahoo, S.C. Venkataramani, N. Prasad, S. Krishnan, R. Kostylev, M. Stamps, R.L. |
| Copyright Year | 1965 |
| Abstract | CoFe2O4/ZnFe2O4 bilayers were deposited by the pulsed laser deposition on amorphous fused quartz substrate at substrate temperature of 350°C and in oxygen pressure of 0.16 mbar. The films were studied after ex-situ annealing for 2 h in air at various temperatures up to 650°C. The magnetic properties of the bilayers were studied at 300 K and at 10 K. Ferromagnetic resonance was carried out at x-band frequencies at room temperature. It was found that as a result of annealing, the diffusion between Co ferrite and Zn ferrite starts around 350°C and leads to a large line width system having magnetization, which remains undetected by Ferromagnetic resonance. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 4200 |
| Ending Page | 4203 |
| Page Count | 4 |
| File Size | 686954 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 49 |
| Issue Number | 7 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-07-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Annealing Magnetic resonance Magnetization Ferrites Temperature measurement Substrates Magnetic properties ferromagnetic resonance Bilayer ferrite thin films |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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