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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Li, G.J. Leung, C.W. Chen, Y.C. Hsu, J.H. Sun, A.C. Lin, K.W. Pong, P.W.T. |
| Copyright Year | 1965 |
| Abstract | The effect of TaOx capping layer on microstructures and magnetic properties of FePt thin films via annealing was studied. The structural ordering of FePt from face-centered cubic to face-centered tetragonal phases depends strongly on the oxygen contents in the capping TaOx layer. The role of the TaOx layer is used to separate the FePt grains, as revealed by TEM. The annealed FePt/TaOx (15%O2/Ar) exhibited the largest out-of-plane coercivity (~2.4 kOe) amongst all samples, compared to that (Hc ~ 4.2 kOe) in the reference FePt layer. At low oxygen content in FePt/TaOx bilayers, the Ta atoms may act as defects to obstruct the FePt ordering whereas at high oxygen contents, the excess oxygen atoms diffuse into the FePt layer and react with Fe to form iron oxides which give rise to the low coercivities, as characterized by the XPS depth profile and binding energy analysis. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 3310 |
| Ending Page | 3313 |
| Page Count | 4 |
| File Size | 741822 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 49 |
| Issue Number | 7 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-07-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Annealing Iron Magnetic properties Coercive force Grain size Educational institutions Atomic layer deposition magnetic properties FePt ion-beam bombardment |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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